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Titre
Influence of Body-Biasing, Supply Voltage, and Temperature on the Detection of Resistive Short Defects in FDSOI Technology
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BSO - Titre
Influence of Body-Biasing, Supply Voltage, and Temperature on the Detection of Resistive Short Defects in FDSOI Technology
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DOI
DOI
10.1109/tnano.2017.2664895
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DOAI
DOAI
10.1109/tnano.2017.2664895
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Identifiant WoS
WOS:000401343900009
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Accès ouvert
OA - Non
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Source - Accès ouvert
OA - Non
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Type d'accès
Non OA
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Editeur
IEEE - Institute of Electrical and Electronics Engineers
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Source
IEEE TRANSACTIONS ON NANOTECHNOLOGY
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ISSN
1536-125X
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Type de document
Article
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Notoriété
3 - Correcte
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CNRS
Oui
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CNRS - Institut
INS2I - Institut des sciences de l'information et de leurs interactions
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uid:/M7HNGH2L
12/10/2021 14:52:42 (latest)
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